Interferential grating sensors for dimensional metrology
Interferential grating sensors for dimensional metrology
Description : Grating interferometers are basic components of length and angle encoder measurement systems, which are widely used in industrial production control. The main objectives of this open position are a) development of new optical schemes for the use of grating interferometers in ultra-precision applications and b) simulations of the optical measurement process under different boundary conditions, both targeting at optimized grating interferometers and improved measurement uncertainties. The development of improved grating interferometers requires understanding and simulation capability of the influence of geometrical deviations of optical elements, stray light, adjustment and environmental influences. Therefore, a mathematical simulation of the interference generation usable for different geometric designs and with parameters for alignment deviations has to be done in the first step. The further development of the grating interferometers will focus on the miniaturization of the sensor for the use as high precision length and angle sensors in micro systems and the improvement of the accuracy of the encoders in ultra-precision applications. This also includes work on improved interferential sensors for existing gratings with larger periods. Dr. Harald Bosse You are required to hold an excellent university degree (master’s or equivalent degree) in physics, chemistry, electrical or mechanical engineering, mathematics, information technology or related fields. The entire program is run in English, so fluency in both written and spoken English is required. Skills in German are welcome. You may be a member of and receive a scholarship from the IGSM for up to 3 years. In your first semester, you will be accepted on a probationary basis. Please note that application is only possible online at www.igsm.tu-bs.de.
Homepage : www.igsm.tu-bs.de
Category : Engineering, Metrology
Contact address : www.igsm.tu-bs.de
Keywords :
Your Name : International Graduate School of Metrology
Email : igsm-application@web.de
Scholarship Tags: dimensional, grating, Interferential, metrology, sensors
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