Optoelectronic primary standard for waveform metrology in the THz frequency range- International Graduate School of Metrology

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June 1, 2009

Optoelectronic primary standard for waveform metrology in the THz frequency range

Description : The goal of this PhD project is the development of an optoelectronic primary standard for traceable measurements of the time-domain response of passive and active high-frequency electronics with bandwidths above 100 GHz. The project builds on previous work where primary time-domain measurement capabilities for passive devices with a bandwidth below 100 GHz were achieved. Extending the measurement capability to the frequency range beyond 100 GHz and to active devices involves considerable challenges. The propagation of optoelectronically generated ultrashort voltage transients is to be characterized carefully in different types of waveguides using advanced ultrafast optical sampling techniques. Moreover, active devices need to be synchronized to the optoelectronic primary standard for characterization and new concepts have to be developed for the improvement of the frequency resolution. Dr. Bieler / PD Dr. Uwe Siegner You are required to hold an excellent university degree (master’s or equivalent degree) in physics, chemistry, electrical or mechanical engineering, mathematics, information technology or related fields. The entire program is run in English, so fluency in both written and spoken English is required. Skills in German are welcome. You may be a member of and receive a scholarship from the IGSM for up to 3 years. In your first semester, you will be accepted on a probationary basis. Please note that application is only possible online at www.igsm.tu-bs.de.
Homepage : www.igsm.tu-bs.de.
Category : Engineering, Metrology
Contact address : www.igsm.tu-bs.de.
Keywords :
Your Name : International Graduate School of Metrology

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